Turret Based Known Good Die (KGD) Test Handler For Si Device, Complete with Laser Marking & AOI
Si30 Series
- ✔ Market leading UPH
- ✔ Equipped with parallel and serial testing solutions
- ✔ Configured with test module XY compensation and real-time force control
- ✔ Scratch-free aligner system on die back metalization
- ✔ Testing and marking capabilities for small die size
- ✔ Dynamic Laser Marking solution
- ✔ Equipped with Advanced Automatic Optical Inspection (AOI)
- ✔ Standard configuration with rework module
Power Module Test Handler
Si Series
- ✔ Tube input and output. Tray format available
- ✔ Suitable for High Voltage / High Current application
- ✔ High Temperature Testing Available
- ✔ Incorporate Laser Marking and 2DID platform
- ✔ AOI Available
- ✔ Complete solutions with Tester available
Turret Based Known Good Die (KGD) High & Room Temperature Test Handler For SiC Device, Complete with AOI
Si10w Plus
- ✔ Market leading UPH
- ✔ Supports 2x High Temperature & 2x Room Temperature Test Sites
- ✔ Equipped with Advanced Automatic Optical Inspection (AOI)
- ✔ Scratch-free aligner system on die back metalization
- ✔ Quick and convenient socket replacement solution
- ✔ Configured with test module XY compensation and real-time force control
- ✔ Fully vision guided alignment
- ✔ Tester Solutions Available with Proven Short Circuit Test Capability - Prevent Die Damage!
Smart Multiple Bin Sorter
Mi Series
- ✔ For SiC post KGD Multiple Bin Sorting
- ✔ Market Leading UPH
- ✔ Wafer Input to Multiple Tape and Reel
- ✔ 4 to 8 Tape & Reel available!
- ✔ Advanced AOI incorporated
- ✔ Detaper available to TnR or Wafer!